Pushing phase and amplitude sensitivity limits in interferometric microscopy

Pushing phase and amplitude sensitivity limits in interferometric microscopy

Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting fac...

Full description

Bibliographic Details
Main Authors: Diaspro, Alberto, Hosseini, Poorya, Zhou, Renjie, Kim, Yang-Hyo, Peres, Chiara, Kuang, Cuifang, Yaqoob, Zahid, So, Peter T. C.
Other Authors: Massachusetts Institute of Technology. Department of Biological Engineering
Format: Article
Published: The Optical Society 2019
Online Access:http://hdl.handle.net/1721.1/120330
https://orcid.org/0000-0001-7347-7887
https://orcid.org/0000-0002-4761-6641
https://orcid.org/0000-0001-5183-576X
https://orcid.org/0000-0003-4698-6488

Internet

http://hdl.handle.net/1721.1/120330
https://orcid.org/0000-0001-7347-7887
https://orcid.org/0000-0002-4761-6641
https://orcid.org/0000-0001-5183-576X
https://orcid.org/0000-0003-4698-6488

Similar Items