Pushing phase and amplitude sensitivity limits in interferometric microscopy
Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting fac...
| Main Authors: | , , , , , , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
The Optical Society
2019
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| Online Access: | http://hdl.handle.net/1721.1/120330 https://orcid.org/0000-0001-7347-7887 https://orcid.org/0000-0002-4761-6641 https://orcid.org/0000-0001-5183-576X https://orcid.org/0000-0003-4698-6488 |
| Summary: | Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer. |
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