Pushing phase and amplitude sensitivity limits in interferometric microscopy

Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting fac...

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Main Authors: Diaspro, Alberto, Hosseini, Poorya, Zhou, Renjie, Kim, Yang-Hyo, Peres, Chiara, Kuang, Cuifang, Yaqoob, Zahid, So, Peter T. C.
Other Authors: Massachusetts Institute of Technology. Department of Biological Engineering
Format: Article
Published: The Optical Society 2019
Online Access:http://hdl.handle.net/1721.1/120330
https://orcid.org/0000-0001-7347-7887
https://orcid.org/0000-0002-4761-6641
https://orcid.org/0000-0001-5183-576X
https://orcid.org/0000-0003-4698-6488
_version_ 1826217913898500096
author Diaspro, Alberto
Hosseini, Poorya
Zhou, Renjie
Kim, Yang-Hyo
Peres, Chiara
Kuang, Cuifang
Yaqoob, Zahid
So, Peter T. C.
author2 Massachusetts Institute of Technology. Department of Biological Engineering
author_facet Massachusetts Institute of Technology. Department of Biological Engineering
Diaspro, Alberto
Hosseini, Poorya
Zhou, Renjie
Kim, Yang-Hyo
Peres, Chiara
Kuang, Cuifang
Yaqoob, Zahid
So, Peter T. C.
author_sort Diaspro, Alberto
collection MIT
description Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer.
first_indexed 2024-09-23T17:11:03Z
format Article
id mit-1721.1/120330
institution Massachusetts Institute of Technology
last_indexed 2024-09-23T17:11:03Z
publishDate 2019
publisher The Optical Society
record_format dspace
spelling mit-1721.1/1203302022-09-30T00:16:09Z Pushing phase and amplitude sensitivity limits in interferometric microscopy Diaspro, Alberto Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. Massachusetts Institute of Technology. Department of Biological Engineering Massachusetts Institute of Technology. Department of Chemistry Massachusetts Institute of Technology. Department of Mechanical Engineering Massachusetts Institute of Technology. Biological Engineering Accelerator Mass Spectrometry Lab Massachusetts Institute of Technology. Laser Biomedical Research Center Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer. National Institutes of Health (U.S.) (1R01EY017656-06) National Institutes of Health (U.S.) (1U01NS090438-01) National Institutes of Health (U.S.) (9P41EB015871-28) National Institutes of Health (U.S.) (DP3DK101024-01) National Institutes of Health (U.S.) (1-R01HL121386-01) National Institutes of Health (U.S.) (1R21NS091982-01) National Institutes of Health (U.S.) (1U01CA202177-01) Hamamatsu Corporation Singapore-MIT Alliance Skolkovo Foundation Koch Institute for Integrative Cancer Research. Bridge Project Initiative Connecticut Children's Medical Center Samsung Advanced Institute of Technology 2019-02-11T19:03:08Z 2019-02-11T19:03:08Z 2016-04 2019-01-03T19:07:24Z Article http://purl.org/eprint/type/JournalArticle 0146-9592 1539-4794 http://hdl.handle.net/1721.1/120330 Hosseini, Poorya, Renjie Zhou, Yang-Hyo Kim, Chiara Peres, Alberto Diaspro, Cuifang Kuang, Zahid Yaqoob, and Peter T. C. So. “Pushing Phase and Amplitude Sensitivity Limits in Interferometric Microscopy.” Optics Letters 41, no. 7 (April 1, 2016): 1656. https://orcid.org/0000-0001-7347-7887 https://orcid.org/0000-0002-4761-6641 https://orcid.org/0000-0001-5183-576X https://orcid.org/0000-0003-4698-6488 http://dx.doi.org/10.1364/OL.41.001656 Optics Letters Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf The Optical Society PMC
spellingShingle Diaspro, Alberto
Hosseini, Poorya
Zhou, Renjie
Kim, Yang-Hyo
Peres, Chiara
Kuang, Cuifang
Yaqoob, Zahid
So, Peter T. C.
Pushing phase and amplitude sensitivity limits in interferometric microscopy
title Pushing phase and amplitude sensitivity limits in interferometric microscopy
title_full Pushing phase and amplitude sensitivity limits in interferometric microscopy
title_fullStr Pushing phase and amplitude sensitivity limits in interferometric microscopy
title_full_unstemmed Pushing phase and amplitude sensitivity limits in interferometric microscopy
title_short Pushing phase and amplitude sensitivity limits in interferometric microscopy
title_sort pushing phase and amplitude sensitivity limits in interferometric microscopy
url http://hdl.handle.net/1721.1/120330
https://orcid.org/0000-0001-7347-7887
https://orcid.org/0000-0002-4761-6641
https://orcid.org/0000-0001-5183-576X
https://orcid.org/0000-0003-4698-6488
work_keys_str_mv AT diasproalberto pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT hosseinipoorya pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT zhourenjie pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT kimyanghyo pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT pereschiara pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT kuangcuifang pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT yaqoobzahid pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy
AT sopetertc pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy