Pushing phase and amplitude sensitivity limits in interferometric microscopy
Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting fac...
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The Optical Society
2019
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Online Access: | http://hdl.handle.net/1721.1/120330 https://orcid.org/0000-0001-7347-7887 https://orcid.org/0000-0002-4761-6641 https://orcid.org/0000-0001-5183-576X https://orcid.org/0000-0003-4698-6488 |
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author | Diaspro, Alberto Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. |
author2 | Massachusetts Institute of Technology. Department of Biological Engineering |
author_facet | Massachusetts Institute of Technology. Department of Biological Engineering Diaspro, Alberto Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. |
author_sort | Diaspro, Alberto |
collection | MIT |
description | Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer. |
first_indexed | 2024-09-23T17:11:03Z |
format | Article |
id | mit-1721.1/120330 |
institution | Massachusetts Institute of Technology |
last_indexed | 2024-09-23T17:11:03Z |
publishDate | 2019 |
publisher | The Optical Society |
record_format | dspace |
spelling | mit-1721.1/1203302022-09-30T00:16:09Z Pushing phase and amplitude sensitivity limits in interferometric microscopy Diaspro, Alberto Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. Massachusetts Institute of Technology. Department of Biological Engineering Massachusetts Institute of Technology. Department of Chemistry Massachusetts Institute of Technology. Department of Mechanical Engineering Massachusetts Institute of Technology. Biological Engineering Accelerator Mass Spectrometry Lab Massachusetts Institute of Technology. Laser Biomedical Research Center Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting factor in interferometric microscopy measurements. Thereafter,wedemonstratehowa state-of-the-art camera with million-level electrons full well capacity can significantly reduce shot noise contribution resulting in a stability of optical path length down to a few picometers even in a near-common-path interferometer. National Institutes of Health (U.S.) (1R01EY017656-06) National Institutes of Health (U.S.) (1U01NS090438-01) National Institutes of Health (U.S.) (9P41EB015871-28) National Institutes of Health (U.S.) (DP3DK101024-01) National Institutes of Health (U.S.) (1-R01HL121386-01) National Institutes of Health (U.S.) (1R21NS091982-01) National Institutes of Health (U.S.) (1U01CA202177-01) Hamamatsu Corporation Singapore-MIT Alliance Skolkovo Foundation Koch Institute for Integrative Cancer Research. Bridge Project Initiative Connecticut Children's Medical Center Samsung Advanced Institute of Technology 2019-02-11T19:03:08Z 2019-02-11T19:03:08Z 2016-04 2019-01-03T19:07:24Z Article http://purl.org/eprint/type/JournalArticle 0146-9592 1539-4794 http://hdl.handle.net/1721.1/120330 Hosseini, Poorya, Renjie Zhou, Yang-Hyo Kim, Chiara Peres, Alberto Diaspro, Cuifang Kuang, Zahid Yaqoob, and Peter T. C. So. “Pushing Phase and Amplitude Sensitivity Limits in Interferometric Microscopy.” Optics Letters 41, no. 7 (April 1, 2016): 1656. https://orcid.org/0000-0001-7347-7887 https://orcid.org/0000-0002-4761-6641 https://orcid.org/0000-0001-5183-576X https://orcid.org/0000-0003-4698-6488 http://dx.doi.org/10.1364/OL.41.001656 Optics Letters Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/pdf The Optical Society PMC |
spellingShingle | Diaspro, Alberto Hosseini, Poorya Zhou, Renjie Kim, Yang-Hyo Peres, Chiara Kuang, Cuifang Yaqoob, Zahid So, Peter T. C. Pushing phase and amplitude sensitivity limits in interferometric microscopy |
title | Pushing phase and amplitude sensitivity limits in interferometric microscopy |
title_full | Pushing phase and amplitude sensitivity limits in interferometric microscopy |
title_fullStr | Pushing phase and amplitude sensitivity limits in interferometric microscopy |
title_full_unstemmed | Pushing phase and amplitude sensitivity limits in interferometric microscopy |
title_short | Pushing phase and amplitude sensitivity limits in interferometric microscopy |
title_sort | pushing phase and amplitude sensitivity limits in interferometric microscopy |
url | http://hdl.handle.net/1721.1/120330 https://orcid.org/0000-0001-7347-7887 https://orcid.org/0000-0002-4761-6641 https://orcid.org/0000-0001-5183-576X https://orcid.org/0000-0003-4698-6488 |
work_keys_str_mv | AT diasproalberto pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT hosseinipoorya pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT zhourenjie pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT kimyanghyo pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT pereschiara pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT kuangcuifang pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT yaqoobzahid pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy AT sopetertc pushingphaseandamplitudesensitivitylimitsininterferometricmicroscopy |