Pushing phase and amplitude sensitivity limits in interferometric microscopy

Pushing phase and amplitude sensitivity limits in interferometric microscopy

Sensitivity of the amplitude and phasemeasurements in interferometric microscopy is influenced by factors such as instrument design and environmental interferences. Through development of a theoretical framework followed by experimental validation, we show photon shot noise is often the limiting fac...

Bibliografske podrobnosti
Main Authors:	Diaspro, Alberto, Hosseini, Poorya, Zhou, Renjie, Kim, Yang-Hyo, Peres, Chiara, Kuang, Cuifang, Yaqoob, Zahid, So, Peter T. C.
Drugi avtorji:	Massachusetts Institute of Technology. Department of Biological Engineering
Format:	Article
Izdano:	The Optical Society 2019
Online dostop:	http://hdl.handle.net/1721.1/120330 https://orcid.org/0000-0001-7347-7887 https://orcid.org/0000-0002-4761-6641 https://orcid.org/0000-0001-5183-576X https://orcid.org/0000-0003-4698-6488

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