Review Article: Active scanning probes: A versatile toolkit for fast imaging and emerging nanofabrication
With the recent advances in the field of nanotechnology, measurement and manipulation requirements at the nanoscale have become more stringent than ever before. In atomic force microscopy, high-speed performance alone is not sufficient without considerations of other aspects of the measurement task,...
| Main Authors: | , , , , , , , , , |
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| Other Authors: | |
| Format: | Article |
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American Vacuum Society (AVS)
2019
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| Online Access: | http://hdl.handle.net/1721.1/120345 https://orcid.org/0000-0002-6314-3717 |