Scanning-probe Single-electron Capacitance Spectroscopy

Scanning-probe Single-electron Capacitance Spectroscopy

The integration of low-temperature scanning-probe techniques and single-electron capacitance spectroscopy represents a powerful tool to study the electronic quantum structure of small systems - including individual atomic dopants in semiconductors. Here we present a capacitance-based method, known a...

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Bibliographic Details
Main Authors: Walsh, Kathleen A., Romanowich, Megan E., Gasseller, Morewell, Kuljanishvili, Irma, Ashoori, Raymond, Tessmer, Stuart
Other Authors: Massachusetts Institute of Technology. Department of Physics
Format: Article
Published: MyJove Corporation 2019
Online Access:http://hdl.handle.net/1721.1/120815
https://orcid.org/0000-0001-5031-1673

Internet

http://hdl.handle.net/1721.1/120815
https://orcid.org/0000-0001-5031-1673

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