Impact of extended defects on ion diffusion and reactivity in binary oxides : assessed by atomistic simulations

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Nuclear Science and Engineering, 2019

Bibliographic Details
Main Author:	Sun, Lixin,Ph. D.Massachusetts Institute of Technology.
Other Authors:	Bilge Yildiz.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2019
Subjects:	Nuclear Science and Engineering.
Online Access:	https://hdl.handle.net/1721.1/121806

Internet

https://hdl.handle.net/1721.1/121806