Root-cause analysis and characterization of oxygen-related defects in silicon PV material : an approach from macro to nanoscale

Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2018

Bibliographic Details
Main Author:	Youssef, Amanda.
Other Authors:	Tonio Buonassisi.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2019
Subjects:	Mechanical Engineering.
Online Access:	https://hdl.handle.net/1721.1/122510

Internet

https://hdl.handle.net/1721.1/122510