Root-cause analysis and characterization of oxygen-related defects in silicon PV material : an approach from macro to nanoscale
Thesis: Ph. D., Massachusetts Institute of Technology, Department of Mechanical Engineering, 2018
Main Author: | Youssef, Amanda. |
---|---|
Other Authors: | Tonio Buonassisi. |
Format: | Thesis |
Language: | eng |
Published: |
Massachusetts Institute of Technology
2019
|
Subjects: | |
Online Access: | https://hdl.handle.net/1721.1/122510 |
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