Managing process development risk : aluminum ultrasonic wire bonding for chip-on-board applications

Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1993, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1993.

Bibliographic Details
Main Author: Smith, Gregory J. (Gregory John)
Other Authors: Lionel C. Kimerling and Steven D. Eppinger.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Online Access:http://hdl.handle.net/1721.1/12393
Description
Summary:Thesis (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1993, and Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1993.