Defect tolerance: fundamental limits and examples

This paper addresses the problem of adding redundancy to a collection of physical objects so that the overall system is more robust to failures. In contrast to its information counterpart, which can exploit parity to protect multiple information symbols from a single erasure, physical redundancy can...

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书目详细资料
Main Authors: Tang, Jennifer Susan, Wang, Da, Polyanskiy, Yury, Wornell, Gregory
其他作者: Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
格式: 文件
语言:English
出版: Institute of Electrical and Electronics Engineers (IEEE) 2020
在线阅读:https://hdl.handle.net/1721.1/124983