Analysis of optical integration between Si3N4 waveguide and a Ge-based optical modulator using a lateral amorphous GeSi taper at the telecommunication wavelength of 1.55 µm

We report on the theoretical investigation of using an amorphous Ge[subscript 0.83]Si[subscript 0.17] lateral taper to enable a low-loss small-footprint optical coupling between a Si[subscript 3]N[subscript 4] waveguide and a low-voltage Ge-based Franz-Keldysh optical modulator on a bulk Si substrat...

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Detalhes bibliográficos
Principais autores: Traiwattanapong, Worawat, Wada, Kazumi, Chaisakul, Papichaya
Outros Autores: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Formato: Artigo
Publicado em: Multidisciplinary Digital Publishing Institute 2020
Acesso em linha:https://hdl.handle.net/1721.1/125389