Accurate measurement of in-plane thermal conductivity of layered materials without metal film transducer using frequency domain thermoreflectance

Measuring anisotropic thermal conductivity has always been a challenging task in thermal metrology. Although recent developments of pump–probe thermoreflectance techniques such as variable spot sizes, offset pump–probe beams, and elliptical beams have enabled the measurement of anisotropic thermal c...

Full description

Bibliographic Details
Main Authors: Qian, Xin, Ding, Zhiwei, Shin, Jungwoo, Schmidt, Aaron, Chen, Gang
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Published: AIP Publishing 2020
Online Access:https://hdl.handle.net/1721.1/125778