Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool

Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.

Bibliographic Details
Main Author: Lee, Deishin
Other Authors: David H. Staelin and Roy E. Welsch.
Format: Thesis
Language:eng
Published: Massachusetts Institute of Technology 2005
Subjects:
Mechanical Engineering
Sloan School of Management
Online Access:http://hdl.handle.net/1721.1/12762

Internet

http://hdl.handle.net/1721.1/12762

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