Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.

Detalhes bibliográficos
Autor principal: Lee, Deishin
Outros Autores: David H. Staelin and Roy E. Welsch.
Formato: Tese
Idioma:eng
Publicado em: Massachusetts Institute of Technology 2005
Assuntos:
Acesso em linha:http://hdl.handle.net/1721.1/12762