Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992.
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| Format: | Thesis |
| Language: | eng |
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Massachusetts Institute of Technology
2005
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| Online Access: | http://hdl.handle.net/1721.1/12762 |
| _version_ | 1826194610150440960 |
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| author | Lee, Deishin |
| author2 | David H. Staelin and Roy E. Welsch. |
| author_facet | David H. Staelin and Roy E. Welsch. Lee, Deishin |
| author_sort | Lee, Deishin |
| collection | MIT |
| description | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992. |
| first_indexed | 2024-09-23T09:58:55Z |
| format | Thesis |
| id | mit-1721.1/12762 |
| institution | Massachusetts Institute of Technology |
| language | eng |
| last_indexed | 2024-09-23T09:58:55Z |
| publishDate | 2005 |
| publisher | Massachusetts Institute of Technology |
| record_format | dspace |
| spelling | mit-1721.1/127622019-04-12T07:34:52Z Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool Lee, Deishin David H. Staelin and Roy E. Welsch. Massachusetts Institute of Technology. Dept. of Mechanical Engineering Sloan School of Management Mechanical Engineering Sloan School of Management Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Mechanical Engineering, and (M.S.)--Massachusetts Institute of Technology, Sloan School of Management, 1992. Includes bibliographical references (leaf 59). by Deishin Lee. M.S. 2005-08-15T18:29:14Z 2005-08-15T18:29:14Z 1992 1992 Thesis http://hdl.handle.net/1721.1/12762 27030749 eng M.I.T. theses are protected by copyright. They may be viewed from this source for any purpose, but reproduction or distribution in any format is prohibited without written permission. See provided URL for inquiries about permission. http://dspace.mit.edu/handle/1721.1/7582 76 leaves 5673357 bytes 5673114 bytes application/pdf application/pdf application/pdf Massachusetts Institute of Technology |
| spellingShingle | Mechanical Engineering Sloan School of Management Lee, Deishin Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| title | Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| title_full | Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| title_fullStr | Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| title_full_unstemmed | Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| title_short | Reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| title_sort | reduction of variability in aircraft manufacturing using photogrammetry as an inspection tool |
| topic | Mechanical Engineering Sloan School of Management |
| url | http://hdl.handle.net/1721.1/12762 |
| work_keys_str_mv | AT leedeishin reductionofvariabilityinaircraftmanufacturingusingphotogrammetryasaninspectiontool |