Registration Uncertainty Quantification Via Low-dimensional Characterization of Geometric Deformations

Registration Uncertainty Quantification Via Low-dimensional Characterization of Geometric Deformations

This paper presents an efficient approach to quantifying image registration uncertainty based on a low-dimensional representation of geometric deformations. In contrast to previous methods, we develop a Bayesian diffeomorphic registration framework in a bandlimited space, rather than a high-dimensio...

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Bibliografiske detaljer
Hovedforfatter: Wells, William M.
Andre forfattere: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Format: Article
Sprog:English
Udgivet: Elsevier BV 2021
Online adgang:https://hdl.handle.net/1721.1/129461

Internet

https://hdl.handle.net/1721.1/129461

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