Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3–edge

Nonlinear XUV-optical transient grating spectroscopy at the Si L2,3–edge

Time-resolved transient grating (TG) spectroscopy facilitates detailed studies of electron dynamics and transport phenomena by means of a periodic excitation of matter with coherent ultrashort light pulses. Several current and next generation free-electron laser (FEL) facilities provide fully cohere...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Bohinc, R., Pamfilidis, G., Rehault, J., Radi, P., Milne, C., Szlachetko, J., Bencivenga, F., Capotondi, F., Cucini, R., Foglia, L., Masciovecchio, C., Mincigrucci, R., Pedersoli, E., Simoncig, A., Mahne, N., Cannizzo, A., Frey, H.M., Ollmann, Z., Feurer, T., Maznev, A. A., Nelson, K., Knopp, G.
Άλλοι συγγραφείς: Massachusetts Institute of Technology. Department of Chemistry
Μορφή: Άρθρο
Γλώσσα:English
Έκδοση: AIP Publishing 2021
Διαθέσιμο Online:https://hdl.handle.net/1721.1/130312

Διαδίκτυο

https://hdl.handle.net/1721.1/130312

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