Volta potential mapping of the gradient strengthened layer in 20CrMnTi by using SKPFM

Abstract The purpose of this paper is to use SKPFM to characterize the gradient strengthened layer induced by the ultrasonic surface rolling process (USRP). A correlation between the dislocation, residual stresses, and SKPFM-derived Volta potential was obtained using scanning Kelvin probe force mic...

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Bibliographic Details
Main Authors: Cheng, Tao, Shi, Wei, Xiang, Song, Ballingerc, Ronald G
Other Authors: Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Format: Article
Language:English
Published: Springer US 2021
Online Access:https://hdl.handle.net/1721.1/131864