Tracking Microstructure Evolution in Complex Biaxial Strain Paths: A Bulge Test Methodology for the Scanning Electron Microscope

Tracking Microstructure Evolution in Complex Biaxial Strain Paths: A Bulge Test Methodology for the Scanning Electron Microscope

Abstract In this work, a novel method is presented to track site-specific microstructure evolution in metallic materials deformed biaxially along proportional and complex strain paths. A miniaturized bulge test setup featuring a removable sample holder was designed to enable increment...

Full description

Bibliographic Details
Main Authors: Plancher, E., Qu, K., Vonk, N.H., Gorji, M.B., Tancogne-Dejean, T., Tasan, C.C.
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:English
Published: Springer US 2021
Online Access:https://hdl.handle.net/1721.1/131890

Internet

https://hdl.handle.net/1721.1/131890

Similar Items