Tracking Microstructure Evolution in Complex Biaxial Strain Paths: A Bulge Test Methodology for the Scanning Electron Microscope
Abstract In this work, a novel method is presented to track site-specific microstructure evolution in metallic materials deformed biaxially along proportional and complex strain paths. A miniaturized bulge test setup featuring a removable sample holder was designed to enable increment...
Main Authors: | Plancher, E., Qu, K., Vonk, N.H., Gorji, M.B., Tancogne-Dejean, T., Tasan, C.C. |
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Other Authors: | Massachusetts Institute of Technology. Department of Materials Science and Engineering |
Format: | Article |
Language: | English |
Published: |
Springer US
2021
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Online Access: | https://hdl.handle.net/1721.1/131890 |
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