A simple method for rejection sampling efficiency improvement on SIMT architectures

Abstract We derive a probability distribution for the possible number of iterations required for a SIMT (single instruction multiple thread) program using rejection sampling to finish creating a sample across all threads. This distribution is found to match a recently proposed distrib...

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Bibliographic Details
Main Authors: Ridley, Gavin, Forget, Benoit
Other Authors: Massachusetts Institute of Technology. Department of Nuclear Science and Engineering
Format: Article
Language:English
Published: Springer US 2021
Online Access:https://hdl.handle.net/1721.1/132084