A simple method for rejection sampling efficiency improvement on SIMT architectures
Abstract We derive a probability distribution for the possible number of iterations required for a SIMT (single instruction multiple thread) program using rejection sampling to finish creating a sample across all threads. This distribution is found to match a recently proposed distrib...
Main Authors: | Ridley, Gavin, Forget, Benoit |
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Other Authors: | Massachusetts Institute of Technology. Department of Nuclear Science and Engineering |
Format: | Article |
Language: | English |
Published: |
Springer US
2021
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Online Access: | https://hdl.handle.net/1721.1/132084 |
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