Active Polarimetric Measurements for Identification and Characterization of Space Debris
© 1965-2011 IEEE. A bench-top polarimeter (λ = 1064 nm) is used to measure the polarimetric bidirectional reflectance distribution function of several common spacecraft materials in both bistatic and monostatic geometries. The Mueller matrix and polarimetric properties of each material were estimate...
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| Format: | Article |
| Language: | English |
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Institute of Electrical and Electronics Engineers (IEEE)
2021
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| Online Access: | https://hdl.handle.net/1721.1/134455 |