High hole mobility in strained In 0.25 Ga 0.75 Sb quantum well with high quality Al 0.95 Ga 0.05 Sb buffer layer

© 2018 Author(s). We have demonstrated high hole mobility in strained In0.25Ga0.75Sb quantum well (QW) structure with a high quality Al0.95Ga0.05Sb buffer layer for future single channel complementary metal-oxide-semiconductor circuits. The Al0.95Ga0.05Sb buffer layer is important to achieve low sub...

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Main Authors: Roh, IlPyo, Kim, SangHyeon, Geum, Dae-Myeong, Lu, Wenjie, Song, YunHeub, del Alamo, Jesús A, Song, JinDong
其他作者: Massachusetts Institute of Technology. Microsystems Technology Laboratories
格式: 文件
语言:English
出版: AIP Publishing 2021
在线阅读:https://hdl.handle.net/1721.1/134741