Measuring thickness in thin NbN films for superconducting devices
© 2019 Author(s). The authors present the use of a commercially available fixed-angle multiwavelength ellipsometer for quickly measuring the thickness of NbN thin films for the fabrication and performance improvement of superconducting nanowire single photon detectors. The process can determine the...
Main Authors: | Medeiros, Owen, Colangelo, Marco, Charaev, Ilya, Berggren, Karl K |
---|---|
Format: | Article |
Language: | English |
Published: |
American Vacuum Society
2021
|
Online Access: | https://hdl.handle.net/1721.1/134920 |
Similar Items
-
Measuring thickness in thin NbN films for superconducting devices
by: Medeiros, Owen, et al.
Published: (2022) -
Infrared transmissometer to measure the thickness of NbN thin films
by: Sunter, Kristen A., et al.
Published: (2015) -
Bias sputtered NbN and superconducting nanowire devices
by: Dane, Andrew Edward, et al.
Published: (2020) -
Probe of spin dynamics in superconducting NbN thin films via spin pumping
by: Yao, Yunyan, et al.
Published: (2018) -
Noise Contribution to Switching Current Distributions in NbN Nanowires
by: Qu, Ashley, et al.
Published: (2021)