More accurate parameterization of positron implantation depth profiles for the sensitivity range of positron-based characterization techniques
© 2020 U.S. Government. Techniques that employ positron annihilation spectroscopy are powerful tools to investigate defect structures and concentrations in materials. A hindrance to experimental design and the interpretation of results lies in the lack of agreement in the literature concerning the p...
| Main Authors: | , , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing
2021
|
| Online Access: | https://hdl.handle.net/1721.1/136975 |