More accurate parameterization of positron implantation depth profiles for the sensitivity range of positron-based characterization techniques
Techniques that employ positron annihilation spectroscopy are powerful tools to investigate defect structures and concentrations in materials. A hindrance to experimental design and the interpretation of results lies in the lack of agreement in the literature concerning the proper form of the positr...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing
2021
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| Online Access: | https://hdl.handle.net/1721.1/136975.2 |