Deep Metric Learning via Facility Location
© 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based...
| Main Authors: | , , , |
|---|---|
| Other Authors: | |
| Format: | Article |
| Language: | English |
| Published: |
IEEE
2021
|
| Online Access: | https://hdl.handle.net/1721.1/137678.2 |