Deep Metric Learning via Facility Location

© 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based...

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Bibliographic Details
Main Authors: Song, Hyun Oh, Jegelka, Stefanie Sabrina, Rathod, Vivek, Murphy, Kevin
Other Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Format: Article
Language:English
Published: IEEE 2021
Online Access:https://hdl.handle.net/1721.1/137678.2
Description
Summary:© 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based on structured prediction, that is aware of the global structure of the embedding space, and which is designed to optimize a clustering quality metric (NMI). We show state of the art performance on standard datasets, such as CUB200-2011 [37], Cars196 [18], and Stanford online products [30] on NMI and R@K evaluation metrics.