Deep Metric Learning via Facility Location

© 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based...

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Main Authors: Song, Hyun Oh, Jegelka, Stefanie Sabrina, Rathod, Vivek, Murphy, Kevin
Other Authors: Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Format: Article
Language:English
Published: IEEE 2021
Online Access:https://hdl.handle.net/1721.1/137678.2
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author Song, Hyun Oh
Jegelka, Stefanie Sabrina
Rathod, Vivek
Murphy, Kevin
author2 Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
author_facet Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory
Song, Hyun Oh
Jegelka, Stefanie Sabrina
Rathod, Vivek
Murphy, Kevin
author_sort Song, Hyun Oh
collection MIT
description © 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based on structured prediction, that is aware of the global structure of the embedding space, and which is designed to optimize a clustering quality metric (NMI). We show state of the art performance on standard datasets, such as CUB200-2011 [37], Cars196 [18], and Stanford online products [30] on NMI and R@K evaluation metrics.
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spelling mit-1721.1/137678.22021-12-20T20:12:46Z Deep Metric Learning via Facility Location Song, Hyun Oh Jegelka, Stefanie Sabrina Rathod, Vivek Murphy, Kevin Massachusetts Institute of Technology. Computer Science and Artificial Intelligence Laboratory © 2017 IEEE. Learning image similarity metrics in an end-to-end fashion with deep networks has demonstrated excellent results on tasks such as clustering and retrieval. However, current methods, all focus on a very local view of the data. In this paper, we propose a new metric learning scheme, based on structured prediction, that is aware of the global structure of the embedding space, and which is designed to optimize a clustering quality metric (NMI). We show state of the art performance on standard datasets, such as CUB200-2011 [37], Cars196 [18], and Stanford online products [30] on NMI and R@K evaluation metrics. 2021-12-20T20:12:46Z 2021-11-08T15:12:27Z 2021-12-20T20:12:46Z 2017-07 2019-06-03T16:26:05Z Article http://purl.org/eprint/type/ConferencePaper https://hdl.handle.net/1721.1/137678.2 Song, Hyun Oh, Jegelka, Stefanie, Rathod, Vivek and Murphy, Kevin. 2017. "Deep Metric Learning via Facility Location." en 10.1109/cvpr.2017.237 Creative Commons Attribution-Noncommercial-Share Alike http://creativecommons.org/licenses/by-nc-sa/4.0/ application/octet-stream IEEE arXiv
spellingShingle Song, Hyun Oh
Jegelka, Stefanie Sabrina
Rathod, Vivek
Murphy, Kevin
Deep Metric Learning via Facility Location
title Deep Metric Learning via Facility Location
title_full Deep Metric Learning via Facility Location
title_fullStr Deep Metric Learning via Facility Location
title_full_unstemmed Deep Metric Learning via Facility Location
title_short Deep Metric Learning via Facility Location
title_sort deep metric learning via facility location
url https://hdl.handle.net/1721.1/137678.2
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AT rathodvivek deepmetriclearningviafacilitylocation
AT murphykevin deepmetriclearningviafacilitylocation