Investigation of reverse recovery effects on the SOA of integrated high frequency power transistors

Investigation of reverse recovery effects on the SOA of integrated high frequency power transistors

Bibliographic Details
Main Authors: Rajagopal, Krishna, Concannon, Ann, Hower, Phil, Farbiz, Farzan, Salman, Akram, Arch, John, Elo, Peter
Format: Article
Language:English
Published: IEEE 2021
Online Access:https://hdl.handle.net/1721.1/137785

Internet

https://hdl.handle.net/1721.1/137785

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