Luo, Y., Parikh, P., Brenner, T. M., Kim, M., Wang, R., Yang, Y., . . . Engineering, M. I. o. T. D. o. M. (2021). Quantitative Specifications to Avoid Degradation during E-Beam and Induced Current Microscopy of Halide Perovskite Devices. American Chemical Society (ACS).
Chicago Style (17th ed.) CitationLuo, Yanqi, et al. Quantitative Specifications to Avoid Degradation During E-Beam and Induced Current Microscopy of Halide Perovskite Devices. American Chemical Society (ACS), 2021.
MLA (9th ed.) CitationLuo, Yanqi, et al. Quantitative Specifications to Avoid Degradation During E-Beam and Induced Current Microscopy of Halide Perovskite Devices. American Chemical Society (ACS), 2021.
Warning: These citations may not always be 100% accurate.