Uncovering the fundamental driver of semiconductor radiation tolerance

Radiation damage is a prominent cause of device failure in orbit, but we do not currently understand what innate property allows some semiconductors to sustain little damage while others accumulate defects rapidly with dose. These devices include circuits required for control and communication as we...

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Bibliographic Details
Main Author: Logan, Julie V.
Other Authors: Short, Michael P.
Format: Thesis
Published: Massachusetts Institute of Technology 2022
Online Access:https://hdl.handle.net/1721.1/140182
https://orcid.org/0000-0001-9787-5249