Uncovering the fundamental driver of semiconductor radiation tolerance
Radiation damage is a prominent cause of device failure in orbit, but we do not currently understand what innate property allows some semiconductors to sustain little damage while others accumulate defects rapidly with dose. These devices include circuits required for control and communication as we...
Main Author: | Logan, Julie V. |
---|---|
Other Authors: | Short, Michael P. |
Format: | Thesis |
Published: |
Massachusetts Institute of Technology
2022
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Online Access: | https://hdl.handle.net/1721.1/140182 https://orcid.org/0000-0001-9787-5249 |
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