Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma

Low-hydrogen-containing amorphous silicon (a-Si) was deposited at a low temperature of 80 °C using a very high frequency (VHF at 162 MHz) plasma system with multi-split electrodes. Using the 162 MHz VHF plasma system, a high deposition rate of a-Si with a relatively high deposition uniformit...

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Main Authors: Kim, Ki Seok, Ji, You-Jin, Kim, Ki-Hyun, Kang, Ji-Eun, Ellingboe, Albert Rogers, Yeom, Geun Young
Other Authors: Massachusetts Institute of Technology. Research Laboratory of Electronics
Format: Article
Published: MDPI AG 2022
Online Access:https://hdl.handle.net/1721.1/140290
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author Kim, Ki Seok
Ji, You-Jin
Kim, Ki-Hyun
Kang, Ji-Eun
Ellingboe, Albert Rogers
Yeom, Geun Young
author2 Massachusetts Institute of Technology. Research Laboratory of Electronics
author_facet Massachusetts Institute of Technology. Research Laboratory of Electronics
Kim, Ki Seok
Ji, You-Jin
Kim, Ki-Hyun
Kang, Ji-Eun
Ellingboe, Albert Rogers
Yeom, Geun Young
author_sort Kim, Ki Seok
collection MIT
description Low-hydrogen-containing amorphous silicon (a-Si) was deposited at a low temperature of 80 &deg;C using a very high frequency (VHF at 162 MHz) plasma system with multi-split electrodes. Using the 162 MHz VHF plasma system, a high deposition rate of a-Si with a relatively high deposition uniformity of 6.7% could be obtained due to the formation of high-ion-density (&gt;10<sup>11</sup> cm<sup>&minus;3</sup>) plasma with SiH<sub>4</sub> and a lack of standing waves by using small multi-split electrodes. The increase in the radio frequency (RF) power decreased the hydrogen content in the deposited silicon film and, at a high RF power of 2000 W, a-Si with a low hydrogen content of 3.78% could be deposited without the need for a dehydrogenation process. The crystallization of the a-Si by ultraviolet (UV) irradiation showed that the a-Si can be crystallized with a crystallinity of 0.8 and a UV energy of 80 J without dehydrogenation. High-resolution transmission electron microscopy showed that the a-Si deposited by the VHF plasma was a very small nanocrystalline-like a-Si and the crystalline size significantly grew with the UV irradiation. We believe that the VHF (162 MHz) multi-split plasma system can be used for a low-cost low-temperature polysilicon (LTPS) process.
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spelling mit-1721.1/1402902024-06-07T17:26:11Z Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma Kim, Ki Seok Ji, You-Jin Kim, Ki-Hyun Kang, Ji-Eun Ellingboe, Albert Rogers Yeom, Geun Young Massachusetts Institute of Technology. Research Laboratory of Electronics Low-hydrogen-containing amorphous silicon (a-Si) was deposited at a low temperature of 80 &deg;C using a very high frequency (VHF at 162 MHz) plasma system with multi-split electrodes. Using the 162 MHz VHF plasma system, a high deposition rate of a-Si with a relatively high deposition uniformity of 6.7% could be obtained due to the formation of high-ion-density (&gt;10<sup>11</sup> cm<sup>&minus;3</sup>) plasma with SiH<sub>4</sub> and a lack of standing waves by using small multi-split electrodes. The increase in the radio frequency (RF) power decreased the hydrogen content in the deposited silicon film and, at a high RF power of 2000 W, a-Si with a low hydrogen content of 3.78% could be deposited without the need for a dehydrogenation process. The crystallization of the a-Si by ultraviolet (UV) irradiation showed that the a-Si can be crystallized with a crystallinity of 0.8 and a UV energy of 80 J without dehydrogenation. High-resolution transmission electron microscopy showed that the a-Si deposited by the VHF plasma was a very small nanocrystalline-like a-Si and the crystalline size significantly grew with the UV irradiation. We believe that the VHF (162 MHz) multi-split plasma system can be used for a low-cost low-temperature polysilicon (LTPS) process. 2022-02-11T17:29:09Z 2022-02-11T17:29:09Z 2022-01-24 2022-02-11T14:46:27Z Article http://purl.org/eprint/type/JournalArticle 2072-666X https://hdl.handle.net/1721.1/140290 Kim, K.S.; Ji, Y.-J.; Kim, K.-H.; Kang, J.-E.; Ellingboe, A.R.; Yeom, G.Y. Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma. Micromachines 13 (2): 173 (2022) 10.3390/mi13020173 Micromachines Creative Commons Attribution https://creativecommons.org/licenses/by/4.0/ application/pdf MDPI AG Multidisciplinary Digital Publishing Institute
spellingShingle Kim, Ki Seok
Ji, You-Jin
Kim, Ki-Hyun
Kang, Ji-Eun
Ellingboe, Albert Rogers
Yeom, Geun Young
Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma
title Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma
title_full Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma
title_fullStr Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma
title_full_unstemmed Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma
title_short Deposition of Very-Low-Hydrogen-Containing Silicon at a Low Temperature Using Very-High-Frequency (162 MHz) SiH4 Plasma
title_sort deposition of very low hydrogen containing silicon at a low temperature using very high frequency 162 mhz sih4 plasma
url https://hdl.handle.net/1721.1/140290
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