The Track One Pilot Program: Who benefits from prioritized patent examination?

Bibliographic Details
Main Authors:	Kuhn, Jeffrey M., Teodorescu, Mike H. M.
Other Authors:	Edgerton Center (Massachusetts Institute of Technology)
Format:	Article
Language:	English
Published:	Wiley 2022
Online Access:	https://hdl.handle.net/1721.1/141003

Internet

https://hdl.handle.net/1721.1/141003