Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge<sub>2</sub>Sb<sub>2</sub>Se<sub>5</sub> thin films

Dielectric spectroscopic investigation of reversible photo-induced changes in amorphous Ge<sub>2</sub>Sb<sub>2</sub>Se<sub>5</sub> thin films

Bibliographic Details
Main Authors: Obeng, Yaw S, Nguyen, Nhan V, Amoah, Papa K, Ahn, Jungjoon, Shalaginov, Mikhail Y, Hu, Juejun, Richardson, Kathleen A
Other Authors: Massachusetts Institute of Technology. Department of Materials Science and Engineering
Format: Article
Language:English
Published: AIP Publishing 2022
Online Access:https://hdl.handle.net/1721.1/142634

Internet

https://hdl.handle.net/1721.1/142634

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