System Design, Noise Reduction, and Improved Dimension Reconstruction for High Performance Ellipsometry

The advancement in nano-manufacturing and many other industries calls for high-performance metrology and inspection methods. Nano-manufacturing has witnessed shrinking critical dimension and demonstrated mass production capability: the lithography process has reached 5nm node and could potentially r...

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Bibliografiske detaljer
Hovedforfatter: Jiang, Bo
Andre forfattere: Youcef-Toumi, Kamal
Format: Thesis
Udgivet: Massachusetts Institute of Technology 2022
Online adgang:https://hdl.handle.net/1721.1/143138

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