System Design, Noise Reduction, and Improved Dimension Reconstruction for High Performance Ellipsometry
The advancement in nano-manufacturing and many other industries calls for high-performance metrology and inspection methods. Nano-manufacturing has witnessed shrinking critical dimension and demonstrated mass production capability: the lithography process has reached 5nm node and could potentially r...
Hovedforfatter: | Jiang, Bo |
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Andre forfattere: | Youcef-Toumi, Kamal |
Format: | Thesis |
Udgivet: |
Massachusetts Institute of Technology
2022
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Online adgang: | https://hdl.handle.net/1721.1/143138 |
Lignende værker
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Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometry
af: Jiang, Bo, et al.
Udgivet: (2022) -
Quantification and reduction of Poisson-Gaussian mixed noise induced errors in ellipsometry
af: Jiang, Bo, et al.
Udgivet: (2022) -
Ellipsometry/
af: International Conference on Ellipsometry (3rd : 1975 : University of Nebraska, Lincoln), et al.
Udgivet: (1976) -
NEUTRON ELLIPSOMETRY
af: Bland, J, et al.
Udgivet: (1993) -
Ellipsometry for industrial applications/
af: 371299 Riedling, Karl
Udgivet: (1988)