Guessing random additive noise decoding with symbol reliability information (SRGRAND)

Bibliographic Details
Main Authors:	Duffy, Ken R, Medard, Muriel, An, Wei
Other Authors:	Massachusetts Institute of Technology. Research Laboratory of Electronics
Format:	Article
Language:	English
Published:	Institute of Electrical and Electronics Engineers (IEEE) 2022
Online Access:	https://hdl.handle.net/1721.1/144021

Internet

https://hdl.handle.net/1721.1/144021