Analytical methods for superresolution dislocation identification in dark-field X-ray microscopy

Abstract We develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM)—achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate...

全面介绍

书目详细资料
Main Authors: Brennan, Michael C., Howard, Marylesa, Marzouk, Youssef, Dresselhaus-Marais, Leora E.
其他作者: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
格式: 文件
语言:English
出版: Springer US 2022
在线阅读:https://hdl.handle.net/1721.1/144366