Analytical methods for superresolution dislocation identification in dark-field X-ray microscopy

Analytical methods for superresolution dislocation identification in dark-field X-ray microscopy

Abstract We develop several inference methods to estimate the position of dislocations from images generated using dark-field X-ray microscopy (DFXM)—achieving superresolution accuracy and principled uncertainty quantification. Using the framework of Bayesian inference, we incorporate...

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Bibliographic Details
Main Authors: Brennan, Michael C., Howard, Marylesa, Marzouk, Youssef, Dresselhaus-Marais, Leora E.
Other Authors: Massachusetts Institute of Technology. Department of Aeronautics and Astronautics
Format: Article
Language:English
Published: Springer US 2022
Online Access:https://hdl.handle.net/1721.1/144366

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https://hdl.handle.net/1721.1/144366

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