Scanning anode field emission microscopy of a single Si emitter
<jats:p> Emitter tip radius nonuniformity results in exponential variations in emission current and a relatively low array utilization. Here, we provide a method of mapping the current and field-factor from a single emitter over a small area using a scanning anode field emission microscope. A...
Main Authors: | Rughoobur, Girish, Ilori, Olusoji O, Akinwande, Akintunde I |
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Other Authors: | Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science |
Format: | Article |
Language: | English |
Published: |
American Vacuum Society
2022
|
Online Access: | https://hdl.handle.net/1721.1/145498 |
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