Robust estimation of charge carrier diffusivity using transient photoluminescence microscopy
<jats:p> Transient microscopy has emerged as a powerful tool for imaging the diffusion of excitons and free charge carriers in optoelectronic materials. In many excitonic materials, extraction of diffusion coefficients can be simplified because of the linear relationship between signal intensi...
| Main Authors: | , , , , , |
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| Other Authors: | |
| Format: | Article |
| Published: |
AIP Publishing
2022
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| Online Access: | https://hdl.handle.net/1721.1/145519 |