Circuits Resilient to Short-Circuit Errors

Bibliographic Details
Main Authors:	Efremenko, Klim, Haeupler, Bernhard, Kalai, Yael Tauman, Kamath, Pritish, Kol, Gillat, Resch, Nicolas, Saxena, Raghuvansh R.
Other Authors:	Massachusetts Institute of Technology. Department of Electrical Engineering and Computer Science
Format:	Article
Language:	English
Published:	ACM\|Proceedings of the 54th Annual ACM SIGACT Symposium on Theory of Computing 2022
Online Access:	https://hdl.handle.net/1721.1/146428

Internet

https://hdl.handle.net/1721.1/146428