Extracting film thickness and optical constants from spectrophotometric data by evolutionary optimization

Extracting film thickness and optical constants from spectrophotometric data by evolutionary optimization

<jats:p>In this paper, we propose a simple and elegant method to extract the thickness and the optical constants of various films from the reflectance and transmittance spectra in the wavelength range of 350 − 1000 nm. The underlying inverse problem is posed here as an optimization problem. To...

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Bibliographic Details
Main Authors: Dutta, Rajdeep, Tian, Siyu Isaac Parker, Liu, Zhe, Lakshminarayanan, Madhavkrishnan, Venkataraj, Selvaraj, Cheng, Yuanhang, Bash, Daniil, Chellappan, Vijila, Buonassisi, Tonio, Jayavelu, Senthilnath
Other Authors: Massachusetts Institute of Technology. Department of Mechanical Engineering
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2023
Online Access:https://hdl.handle.net/1721.1/150807

Internet

https://hdl.handle.net/1721.1/150807

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