Design and Control of Versatile High-Speed and Large-Range Atomic Force Microscopes
Microscopy instruments are important in nano-technology research for imaging of nanoscale phenomena. Among such tools is the atomic force microscope (AFM) for nanoscale imaging and surface characterization. An AFM scans a micro-cantilever over the sample surface to measure various quantities from th...
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| Format: | Thesis |
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Massachusetts Institute of Technology
2023
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| Online Access: | https://hdl.handle.net/1721.1/153043 |