The effect of low energy ion bombardment on the crystallographic orientation of thin films

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1985.

Bibliographic Details
Main Author:	Yu, Lock See
Other Authors:	L. Rafael Reif.
Format:	Thesis
Language:	eng
Published:	Massachusetts Institute of Technology 2005
Subjects:	Materials Science and Engineering.
Online Access:	http://hdl.handle.net/1721.1/15310

Internet

http://hdl.handle.net/1721.1/15310