The effect of low energy ion bombardment on the crystallographic orientation of thin films
Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1985.
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| Format: | Thesis |
| Jezik: | eng |
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Massachusetts Institute of Technology
2005
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| Online dostop: | http://hdl.handle.net/1721.1/15310 |
| Izvleček: | Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1985. |
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