The effect of low energy ion bombardment on the crystallographic orientation of thin films

The effect of low energy ion bombardment on the crystallographic orientation of thin films

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1985.

书目详细资料
主要作者:	Yu, Lock See
其他作者:	L. Rafael Reif.
格式:	Thesis
语言:	eng
出版:	Massachusetts Institute of Technology 2005
主题:	Materials Science and Engineering.
在线阅读:	http://hdl.handle.net/1721.1/15310

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