The effect of low energy ion bombardment on the crystallographic orientation of thin films

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Materials Science and Engineering, 1985.

书目详细资料
主要作者: Yu, Lock See
其他作者: L. Rafael Reif.
格式: Thesis
语言:eng
出版: Massachusetts Institute of Technology 2005
主题:
在线阅读:http://hdl.handle.net/1721.1/15310

相似书籍