Lab-to-Fab Monolithic 3D Integrated Carbon Nanotube Transistors: Scaling and Reliability

Conventional scaling of silicon integrated electronics can no longer yield improvements that keep pace with the increasing computing demands of abundant-data applications. Moreover, for data intensive computing applications, a majority of system energy is consumed moving data between compute and off...

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Bibliographic Details
Main Author: Yu, Andrew C.
Other Authors: Shulaker, Max M.
Format: Thesis
Published: Massachusetts Institute of Technology 2024
Online Access:https://hdl.handle.net/1721.1/156634